spacer
EDP Sciences Journals List
Home arrow Document
 
 

|   Abstract  |   PDF (304.7 KB)  |   References  |

Free access article

References of  Eur. Phys. J. Special Topics 158, 99-105
  1. M. Wuttig, C. Craciunescu, J. Li, Mater. Trans. JIM 41, 933 (2000)
  2. H. Rumpf, J. Feydt, D. Levandovski, A. Ludwig, B. Winzek, E. Quandt, P. Zhao, M. Wuttig, Proc. SPIE 5053, 191 (2003)
  3. J.W. Dong, Q.J. Xie, J. Lu, C. Adelmann, C.J. Palmstrøm, J. Cui, Q. Pan, T.W. Shield, R.D. James, S. McKernan, J. Appl. Phys. 95, 2593 (2004) [CrossRef]
  4. J. Dubowik, Y.V. Kudryavtsev, Y.P. Lee, J. Appl. Phys. 95, 2912 (2004) [CrossRef]
  5. V.A. Chernenko, M. Ohtsuka, M. Kohl, V.V. Khovailo, T. Takagi, Smart Mater. Struct. 14, S245 (2005) [CrossRef]
  6. V.A. Chernenko, R. Lopez Anton, M. Kohl, M. Otsuka, I. Orue, J.M. Barandiaran, J. Phys. Condens. Matter 17, 5215 (2005) [CrossRef]
  7. M. Kohl, V.A. Chernenko, M. Ohtsuka, H. Reuter, T. Takagi, Mater. Res. Soc. Symp. Proc. 855E, W2.8.1 (2005)
  8. V.A. Chernenko, M. Kohl, V.A. L'vov, V.M. Kniazkyi, M. Ohtsuka, O. Kraft, Mater. Trans. 47, 619 (2006) [CrossRef]
  9. V.A. Chernenko, M. Kohl, S. Doyle, P. Müllner, M. Ohtsuka, Scr. Mater. 54, 1287 (2006) [CrossRef]
  10. M. Kohl, A. Agarwal, V.A. Chernenko, M. Ohtsuka, K. Seemann, Mater. Sci. Eng. A 438-440, 940 (2006) [CrossRef]
  11. V.A. Chernenko, S. Doyle, M. Kohl, P. Müllner, S. Besseghini, M. Ohtsuka, Z. Kristall (2007) (in print)
  12. S. Besseghini, A. Gambardella, V.A. Chernenko, M. Hagler, C. Pohl, P. Müllner, M. Ohtsuka, S. Doyle, Eur. Phys. J. Special Topics 158, 179 (2008)
  13. V.A. Chernenko, S. Besseghini, M. Hagler, P. Müllner, M. Ohtsuka, F. Stortiero, Mater. Sci. Eng. A (2007) [doi:10.1016/j.msea.2006.12.206]
  14. A.L. Roytburd, T.S. Kim, Q. Su, J. Slutsker, M. Wuttig, Acta Mater. 46, 5095 (1998) [CrossRef]
  15. H.T. Hesemann, P. Müllner, O. Kraft, E. Arzt, J. Phys. (France) 112, 107 (2003)
  16. O. Kraft, H. Hommel, E. Arzt, Mater. Sci. Eng. A 288, 209 (2000) [CrossRef]
  17. I.C. Noyan, L.B. Cohen, Residual Stress: Measurement by Diffraction and Interpretation (Springer-Verlag, New York, 1987)
  18. P.S. Previy, Developments in Materials Characterization Technologies, edited by G. Vander Voort, J. Friel (ASM International, Materials Park, Ohio, 1996), p. 103
  19. M. Hagler, V.A. Chernenko, M. Ohtsuka, S. Besseghini, P. Müllner, MRS Spring Meeting, Symposium J (to be published in electronic format)
  20. W.D. Nix, Met. Trans. A 20, 2217 (1989) [CrossRef]
  21. W.D. Nix, Scr. Mater. 39, 545 (1998) [CrossRef]
  22. R.-M. Keller, S.P. Baker, E. Arzt, J. Mater. Res. 13, 1307 (1998) [CrossRef]
  23. B. von Blanckenhagen, E. Arzt, P. Gumbsch, Acta Mater. 52, 773 (2004) [CrossRef]
  24. M. Wuttig, Y. Zheng, J.S. Slutsker, K. Mori, Q. Su, Scr. Mater. 41, 529 (1999) [CrossRef]